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Measurements and modeling of atomic-scale sidewall roughness and losses in integrated photonic devices. (arXiv:2105.11477v1 [physics.optics]) http://arxiv.org/abs/2105.11477
Measurements and modeling of atomic-scale sidewall roughness and losses in integrated photonic devices. (arXiv:2105.11477v1 [physics.optics]) http://arxiv.org/abs/2105.11477