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A semi-analytical approach for the characterization of ordered 3D nano structures using grazing-incidence X-ray fluorescence. (arXiv:1908.11452v1 [physics.comp-ph]) http://arxiv.org/abs/1908.11452
A semi-analytical approach for the characterization of ordered 3D nano structures using grazing-incidence X-ray fluorescence. (arXiv:1908.11452v1 [physics.comp-ph]) http://arxiv.org/abs/1908.11452