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Measurement Series for Validation of Critical Point Model in 600 Scanning Micro Mirrors Affected by Three-Wave Down-Conversion. (arXiv:1912.06189v1 [physics.app-ph]) http://arxiv.org/abs/1912.06189
Measurement Series for Validation of Critical Point Model in 600 Scanning Micro Mirrors Affected by Three-Wave Down-Conversion. (arXiv:1912.06189v1 [physics.app-ph]) http://arxiv.org/abs/1912.06189
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