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Robust estimation based on one-shot device test data under log-normal lifetimes. (arXiv:2211.02118v1 [stat.AP]) http://arxiv.org/abs/2211.02118
Robust estimation based on one-shot device test data under log-normal lifetimes. (arXiv:2211.02118v1 [stat.AP]) http://arxiv.org/abs/2211.02118